共 17 条
- [1] Andersen H. H., 1981, Sputtering by particle bombardment I. Physical sputtering of single-element solids, P145
- [2] BLOCH P, 1979, 1ST EUR S PHYS CHEM
- [3] A MICROCOMPUTER BASED DIGITAL IMAGING-SYSTEM FOR ION MICROANALYSIS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1985, 138 (APR): : 15 - 28
- [4] SECONDARY ION MASS-SPECTROMETRY DIGITAL IMAGING FOR THE 3-DIMENSIONAL CHEMICAL CHARACTERIZATION OF SOLID-STATE DEVICES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (06): : 2102 - 2107
- [5] AN AUTOMATED-METHOD FOR HIGH DYNAMIC-RANGE SECONDARY ION IMAGE DEPTH PROFILING [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (05): : 2317 - 2322
- [6] BRYAN SR, 1986, J VAC SCI TECHNOL A, V5, P9
- [7] CHUNG FH, 1981, AIR PARTICULATES INS, P89