ATOM-PROBE MASS ANALYSIS WITH A SIGNAL HEIGHT DISCRIMINATING TIMER

被引:2
作者
NISHIKAWA, O
OIDA, K
TOMITORI, M
机构
来源
JOURNAL DE PHYSIQUE | 1986年 / 47卷 / C-7期
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D O I
10.1051/jphyscol:1986786
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学科分类号
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页码:515 / 520
页数:6
相关论文
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BLAVETTE D, 1985, 32ND INT FIELD EM S
[2]  
NISHIKAWA O, 1985, 32ND INT FIELD EM S
[3]   QUANTIFICATION OF ATOM-PROBE FIM DATA AND AN APPLICATION TO INVESTIGATION OF SURFACE SEGREGATION OF ALLOYS [J].
TSONG, TT ;
NG, YS ;
KRISHNASWAMY, SV .
APPLIED PHYSICS LETTERS, 1978, 32 (11) :778-780