DATA-PROCESSING FOR SCANNING TUNNELING MICROSCOPY

被引：8

作者：

ROSENTHALER, L

HIDBER, HR

TONIN, A

ENG, L

STAUFER, U

WIESENDANGER, R

GUNTHERODT, HJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575402

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：393 / 397

页数：5

共 7 条

[1] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[2]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[4]

CASTLEMAN KR, 1979, DIGITAL IMAGE PROCES, P113

[5]

FOLEY JD, 1984, FUNDAMENTALS INTERAC, P575

[6] NANOMETER SCALE STRUCTURE FABRICATION WITH THE SCANNING TUNNELING MICROSCOPE [J].

STAUFER, U ;

WIESENDANGER, R ;

ENG, L ;

ROSENTHALER, L ;

HIDBER, HR ;

GUNTHERODT, HJ ;

GARCIA, N .

APPLIED PHYSICS LETTERS, 1987, 51 (04) :244-246

[7]

WILLIAMS CS, 1986, DESIGNING DIGITAL FI, P257

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