SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] ANDERSEN CA, 1970, P APOLLO 11 LUNAR SC, V1, P159

[3] Andersen CA., 1970, INT J MASS SPECTROM, V3, P413, DOI [10.1016/0020-7381(70)80001-8, DOI 10.1016/0020-7381(70)80001-8]

[4] ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61

[5] TANDEM MASS SPECTROMETER FOR SECONDARY ION STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 49 - +

[6] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[7] CASTAING R, 1971, ADV MASS SPECTROM, V5, P419

[8] Castaing R., 1962, J MICROSCOPIE, V1, P395

[9] OXYGEN ISOTOPIC CONCENTRATION GRADIENT DETERMINATION WITH CAMECA ION MASS ANALYZER [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 416 - &

[10] CONTAMIN P, 1968, CR ACAD SCI C CHIM, V267, P805

[1] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[2] ANDERSEN CA, 1970, P APOLLO 11 LUNAR SC, V1, P159

[3] Andersen CA., 1970, INT J MASS SPECTROM, V3, P413, DOI [10.1016/0020-7381(70)80001-8, DOI 10.1016/0020-7381(70)80001-8]

[4] ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61

[5] TANDEM MASS SPECTROMETER FOR SECONDARY ION STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 49 - +

[6] ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J]. ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05): : 403 - +

[7] CASTAING R, 1971, ADV MASS SPECTROM, V5, P419

[8] Castaing R., 1962, J MICROSCOPIE, V1, P395

[9] OXYGEN ISOTOPIC CONCENTRATION GRADIENT DETERMINATION WITH CAMECA ION MASS ANALYZER [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 416 - &

[10] CONTAMIN P, 1968, CR ACAD SCI C CHIM, V267, P805