IDENTIFICATION OF (0001) AND (0001) SURFACES OF SILICON CARBIDE

[1] ADDAMIANO A, PRIVATE COMMUNICATIO

[2] X-RAY METHOD FOR DETERMINATION OF POLARITY OF SIC CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3560 - &

[3] ETCHING OF ALPHA-SILICON CARBIDE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (07): : 905 - &

[4] CAMPORT CB, 1968, MAY BOST M

[5] Faust J. W., 1960, SILICON CARBIDE HIGH, P403

[6] OCONNOR JR, 1960, SILICON CARBIDE ED, P403

[1] ADDAMIANO A, PRIVATE COMMUNICATIO

[2] X-RAY METHOD FOR DETERMINATION OF POLARITY OF SIC CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (11) : 3560 - &

[3] ETCHING OF ALPHA-SILICON CARBIDE [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (07): : 905 - &

[4] CAMPORT CB, 1968, MAY BOST M

[5] Faust J. W., 1960, SILICON CARBIDE HIGH, P403

[6] OCONNOR JR, 1960, SILICON CARBIDE ED, P403