EMPIRICAL TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX OF SEMICONDUCTORS

被引:251
作者
HERVE, PJL
VANDAMME, LKJ
机构
[1] Department of Electrical Engineering, Eindhoven University of Technology
关键词
D O I
10.1063/1.359248
中图分类号
O59 [应用物理学];
学科分类号
摘要
Values of the temperature coefficient of the refractive index were obtained from the derivation of a simple relation between energy band-gap and refractive index in semiconductors. These values, (dn/dT)/n, were compared to the experimental data found in literature. Our model, with only one fitting parameter dB/dT=2.5×10-5 K-1 for all semiconductors, results in the best agreement with experimental data. © 1995 American Institute of Physics.
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页码:5476 / 5477
页数:2
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