PROBING DEPTH IN PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY

被引：477

作者：

LINDAU, I ^{[1
]}

SPICER, WE ^{[1
]}

机构：

[1] STANFORD UNIV,ELECTR LABS,STANFORD,CA 94305

来源：

关键词：

D O I：

10.1016/0368-2048(74)80024-1

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：409 / 413

页数：5

共 37 条

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