PREDICTED ABSORPTANCE OF YBa2Cu3O7/YSZ/Si MULTILAYER STRUCTURES FOR INFRARED DETECTORS

被引：19

作者：

Zhang, Z. M. ^{[1
]}

Flik, M. I. ^{[1
]}

机构：

[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1993年 / 3卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/77.233900

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High-T-C superconducting YBa2Cu3O7 films deposited on silicon substrates with yttria-stabilized-zirconia (YSZ) buffer layers have significant potential for radiation detectors. This study analyzes the infrared absorptance of a YBa2Cu3O7/YSZ/Si multilayer structure, which strongly influences the detector performance and depends on the layer thicknesses. The electromagnetic field inside the layers is determined based on the Maxwell equations and the optical constants of these materials. The film thicknesses yielding maximum absorptance are obtained for different wavelengths. The spatial distribution of power flux is determined by integrating the Poynting vector over a finite spectral region. The analytical method presented in this study is recommended for the radiative design of high-T-C superconducting detectors based on absorbing multilayer structures.

引用

页码：1604 / 1607

页数：4

共 14 条

[1] HIGH-TC SUPERCONDUCTING THIN-FILMS - AN ANALYSIS OF REFLECTANCE SPECTRA [J].