A HIGH-RESOLUTION EXAFS AND NEAR EDGE STUDY OF GEO2 GLASS

被引:30
作者
OKUNO, M [1 ]
YIN, CD [1 ]
MORIKAWA, H [1 ]
MARUMO, F [1 ]
OYANAGI, H [1 ]
机构
[1] ELECTROTECH LAB,SAKURA,IBARAKI 305,JAPAN
关键词
D O I
10.1016/S0022-3093(86)80005-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:312 / 320
页数:9
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