ANALYSIS OF NEUTRON AND X-RAY REFLECTIVITY DATA .1. THEORY

被引：72

作者：

HAMLEY, IW

PEDERSEN, JS

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

[2] RISO NATL LAB,DEPT SOLID STATE PHYS,DK-4000 ROSKILDE,DENMARK

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1994年 / 27卷 / pt 1期

关键词：

D O I：

10.1107/S0021889893006260

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.

引用

页码：29 / 35

页数：7

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