STUDY OF THE STRUCTURE OF SILICA GLASS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：34

作者：

BANDO, Y ^{[1
]}

ISHIZUKA, K ^{[1
]}

机构：

[1] KYOTO UNIV, INST CHEM RES, UJI, KYOTO 611, JAPAN

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1979年 / 33卷 / 03期

关键词：

D O I：

10.1016/0022-3093(79)90110-8

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The structure of silica glass was investigated by high-resolution electron microscopy. Observed dark field images were compared with those calculated by a kinematical electron diffraction theory on the basis of random and crystallite models. Bright small spots with sharp contrast were observed in the dark field image, which were found to originate from crystallites. It was indicated that small crystallites of about 17 Å in size were present in silica glass. © 1979.

引用

页码：375 / 382

页数：8

共 18 条

[1] STRUCTURE OF VITREOUS-SILICA - VALIDITY OF RANDOM NETWORK THEORY [J].