STATIC SECONDARY ION MASS-SPECTROMETRY (SIMS) OF POLYANILINES - A PRELIMINARY-STUDY

被引:12
作者
CHAN, HSO [1 ]
ANG, SG [1 ]
HO, PKH [1 ]
JOHNSON, D [1 ]
机构
[1] UNIV MANCHESTER,INST SCI & TECHNOL,CTR SURFACE & MAT ANAL,MANCHESTER M60 1QD,LANCS,ENGLAND
关键词
D O I
10.1016/0379-6779(90)90239-H
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Three chemically prepared polyanilines (PANIs) have been studied by static secondary ion mass spectrometry under low 'damage' conditions. Information obtained from the positive ion spectra is limited. The negative ion spectra, however, revealed fragments of up to 290 daltons which are molecular specific to provide structural information. The results suggest consecutive doping of amine and imine nitrogen atoms in parts of the polyaniline chain. © 1990.
引用
收藏
页码:103 / 110
页数:8
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