HIGH-DENSITY CID IMAGERS

被引：7

作者：

BROWN, DM

GHEZZO, M

SARGENT, PL

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1978年 / 25卷 / 02期

关键词：

D O I：

10.1109/T-ED.1978.19042

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：79 / 84

页数：6

共 16 条

[1]

[Anonymous], 1975, MR, V35, P33

[2] SI-SIO2 FAST INTERFACE STATE MEASUREMENTS [J].

BROWN, DM ;

GRAY, PV .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (07) :760-+

[3] TRANSPARENT METAL-OXIDE ELECTRODE CID IMAGER [J].

BROWN, DM ;

GHEZZO, M ;

GARFINKEL, M .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1976, 11 (01) :128-132

[4] TRANSPARENT METAL-OXIDE ELECTRODE CID IMAGER [J].

BROWN, DM ;

GHEZZO, M ;

GARFINKEL, M .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (02) :196-200

[5]

BROWN DM, 1968, J ELECTROCHEM SOC, V115, P313

[6]

BROWN DM, 1961, Patent No. 2988613

[7]

BROWN DM, 1977, Patent No. 4024562

[8]

BROWN DM, 1977, Patent No. 4012767

[9]

BURKE HK, 1978, FEB P C LAS EL OPT S

[10]

CUNNINGHAM J, 1975, ELECTRONICS 1211, P101

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