OUT-OF-PLANE SCATTERING IN OPTICAL-WAVEGUIDES

被引:27
作者
GOTTLIEB, M
BRANDT, GB
CONROY, JJ
机构
[1] Westinghouse R&D Center, Pittsburgh
来源
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1979年 / 26卷 / 12期
关键词
D O I
10.1109/TCS.1979.1084604
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements were made of the light scattered out of the plane of optical waveguides sputtered onto substrates of thermally oxidized silicon. The angular distribution of the scattered light can be explained theoretically as having as its origin roughness at the waveguide–air interface. For waveguides of very high intensity scatter, the patterns are consistent with classical MIe scattering by spherical particles. This type of measurement may be useful in determining optimum conditions for fabricating very low-loss waveguides. © 1979 IEEE
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页码:1029 / 1035
页数:7
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