X-RAY-DIFFRACTION ANALYSIS OF SIO2 STRUCTURE

被引：15

作者：

HIMMEL, B ^{[1
]}

GERBER, T ^{[1
]}

HEYER, W ^{[1
]}

BLAU, W ^{[1
]}

机构：

[1] MARTIN LUTHER UNIV,SEKT CHEM,DDR-4010 HALLE,GER DEM REP

来源：

JOURNAL OF MATERIALS SCIENCE | 1987年 / 22卷 / 04期

关键词：

D O I：

10.1007/BF01233136

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1374 / 1378

页数：5

共 30 条

[1] STRUCTURE OF VITREOUS-SILICA - VALIDITY OF RANDOM NETWORK THEORY [J].

BELL, RJ ;

DEAN, P .

PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1381-&

[2] X-RAY STRUCTURAL-ANALYSIS OF ACTIVATED SILICA [J].

BOCHYNSKI, Z ;

STACHOWIAK, M ;

MOCYDLARZ, S .

JOURNAL OF MATERIALS SCIENCE, 1984, 19 (06) :1876-1884

[3]

Bruckner R., 1970, Journal of Non-Crystalline Solids, V5, P123, DOI 10.1016/0022-3093(70)90190-0

[4] THE NATURE OF THE SI-O-SI BOND ANGLE DISTRIBUTION IN VITREOUS SILICA [J].

COOMBS, PG ;

DENATALE, JF ;

HOOD, PJ ;

MCELFRESH, DK ;

WORTMAN, RS ;

SHACKELFORD, JF .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 51 (04) :L39-L42

[5] THE STRUCTURE OF SILICA GLASS [J].

GERBER, T ;

HIMMEL, B .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1986, 83 (03) :324-334

[6]

GERBER T, 1983, THESIS WILHELMPIECK

[7] REVISED PARAMETERS OF ANALYTIC FITS FOR COHERENT AND INCOHERENT SCATTERED X-RAY INTENSITIES OF FIRST 36 ATOMS [J].

HAJDU, F .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, 28 (03) :250-&

[8] AN X-RAY-SCATTERING STUDY OF VITREOUS KFESI3O8 AND NAFESI3O8 AND REINVESTIGATION OF VITREOUS SIO2 USING QUASI-CRYSTALLINE MODELING [J].

HENDERSON, GS ;

FLEET, ME ;

BANCROFT, GM .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1984, 68 (2-3) :333-349

[9]

HEYER W, 1977, Z CHEM, V17, P212

[10] X-RAY-DIFFRACTION INVESTIGATIONS OF DIFFERENTLY PREPARED AMORPHOUS SILICAS [J].

HIMMEL, B ;

GERBER, T ;

NEUMANN, HG .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 88 (02) :K127-K130

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