Using Nonparametric Goodness-of-Fit Tests to Validate Accelerated Failure Time Models

被引：11

作者：

Galanova, N. S. ^{[1
]}

Lemeshko, B. Yu. ^{[1
]}

Chimitova, E. V. ^{[1
]}

机构：

[1] Novosibirsk State Tech Univ, Pr Karla Marksa 20, Novosibirsk 630092, Russia

来源：

OPTOELECTRONICS INSTRUMENTATION AND DATA PROCESSING | 2012年 / 48卷 / 06期

关键词：

accelerated failure time tests; AFT models; censored measurements; Kaplan-Meier estimates; nonparametric goodness-of-fit tests; modified tests;

D O I：

10.3103/S8756699012060064

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The construction of a reliability function from the results of accelerated failure time (AFT) models is considered. The constructed AFT models are verified by analyzing a sample of residuals. The fit of the residual sample to the baseline probability distribution is tested using modified nonparametric goodness-of-fit tests. In the absence of censoring in tests, it is proposed to use previously constructed models of distribution of statistics for testing composite hypotheses. In the case of censoring of type I or II, distributions of the goodness-of-fit test statistics are found by statistical modeling.

引用

页码：580 / 592

页数：13

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