A SIMPLE ETCHING TECHNIQUE FOR REVEALING DISLOCATIONS IN SILICON

被引:5
作者
SPRAY, CAFT
机构
来源
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B | 1956年 / 69卷 / 06期
关键词
D O I
10.1088/0370-1301/69/6/116
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
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页码:689 / &
相关论文
共 3 条
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KURTZ, AD ;
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[2]   ETCH PITS AND DISLOCATIONS IN GERMANIUM AND SILICON [J].
OBERLY, JJ .
JOURNAL OF METALS, 1954, 6 (09) :1025-1026
[3]   OBSERVATIONS OF DISLOCATIONS IN LINEAGE BOUNDARIES IN GERMANIUM [J].
VOGEL, FL ;
PFANN, WG ;
COREY, HE ;
THOMAS, EE .
PHYSICAL REVIEW, 1953, 90 (03) :489-490