OPTICAL PHASE SHIFT MEASUREMENT OF RESIDUAL DEFECTS IN VAPOR EPITAXIAL GAASP

被引：18

作者：

ZWICKER, HR

SCIFRES, DR

HOLONYAK, N

DUPUIS, RD

BURNHAM, RD

BURD, JW

ALFEROV, ZI

机构：

来源：

关键词：

D O I：

10.1016/0038-1098(71)90151-7

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：587 / &

共 13 条

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[J]. JOURNAL OF CHEMICAL PHYSICS, 1953, 21 (08) : 1315 - 1322
[2] BURD JW, 1969, T METALL SOC AIME, V245, P571
[3] BURNHAM RA, TO BE PUBLISHED
[4] INTERFEROMETRIC PHASE SHIFT TECHNIQUE FOR MEASURING SHORT FLUORESCENT LIFETIMES
CARBONE, RJ
LONGAKER, PR
[J]. APPLIED PHYSICS LETTERS, 1964, 4 (02) : 32 - &
[5] DUPUIS RD, 1971, THESIS U ILLINOIS
[6] SPONTANEOUS AND STIMULATED CARRIER LIFETIME AND SPECTRAL OUTPUT OF CDSE (77DEGREESK)
KEUNE, DL
HOLONYAK, N
DAPKUS, PD
BURNHAM, RD
[J]. APPLIED PHYSICS LETTERS, 1970, 17 (01) : 42 - &
[7] KEUNE DL, TO BE PUBLISHED
[8] MERKELO H, 1969, SCIENCE, V164, P310
[9] PIERRON ED, PRIVATE COMMUNICATIO
[10] SCIFRES DR, TO BE PUBLISHED