NATIVE TELLURIUM DIOXIDE LAYER ON CADMIUM TELLURIDE - A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY

被引：36

作者：

PONCE, FA ^{[1
]}

SINCLAIR, R ^{[1
]}

BUBE, RH ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305

来源：

关键词：

D O I：

10.1063/1.92623

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：951 / 953

页数：3

共 8 条

HAGEALI, M ;

STUCK, R ;

SAXENA, AN ;

SIFFERT, P .

APPLIED PHYSICS, 1979, 19 (01) :25-33

[2]

Ito T, 1939, Z KRISTALLOGR, V102, P13

[3] SURFACE-LAYERS ON CADMIUM TELLURIDE [J].

PATTERSON, MH ;

WILLIAMS, RH .

[4]

Ponce F. A., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P503

VARMA, RR ;

PATTERSON, MH ;

WILLIAMS, RH .

[6]

Wyckoff R., 1963, CRYST STRUCT, V1, P254

[7]

YAMASHITA T, PHILOS MAG

[8] RAMAN DETECTION OF TELLURIUM LAYERS ON SURFACES OF CDTE [J].

ZITTER, RN .