CHARACTERIZATION AND TEST-RESULTS FOR A 272K BUBBLE MEMORY PACKAGE

被引：26

作者：

BOBECK, AH ^{[1
]}

DANYLCHUK, I ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1977年 / 13卷 / 05期

关键词：

D O I：

10.1109/TMAG.1977.1059581

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1370 / 1372

页数：3

共 10 条

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[2]

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[3] 68 KBIT CAPACITY 16 MUM-PERIOD MAGNETIC-BUBBLE MEMORY CHIP DESIGN WITH 2MUM-MINIMUM FEATURES [J].

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[6] MAGNETIC-BUBBLE DUAL-IN-LINE PACKAGE (DIP) FUNCTIONAL AND RELIABILITY TESTING [J].

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SMITH, DH .

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[7]

NELSON TJ, 1977, 1977 INT C

[8]

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[9]

WILLIAMS JE, 1977, APR EL 77 C

[10]

YU EY, 1977, 1977 INT C

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