IDENTIFYING THE SOURCE OF 1/F NOISE IN SQUIDS MADE FROM HIGH-TEMPERATURE SUPERCONDUCTORS

被引:57
作者
KOCH, RH
EIDELLOTH, W
OH, B
ROBERTAZZI, RP
ANDREK, SA
GALLAGHER, WJ
机构
[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights
关键词
D O I
10.1063/1.106619
中图分类号
O59 [应用物理学];
学科分类号
摘要
We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the 1/f noise in the our devices results from fluctuations in the magnitude of the critical current of the Josephson junctions that form the SQUID. Operating the SQUID while the bias current direction was being alternated canceled the 1/f noise power from these fluctuations and reduced the output noise power by two orders of magnitude. Using this process, we have measured the 1/f noise in several SQUIDs to be 1 x 10(-7) PHI-0(2)/Hz at 0.1 Hz and 77 K, the lowest value reported to date.
引用
收藏
页码:507 / 509
页数:3
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