MODIFIED DOUBLE-BEAM INTERFEROMETER USING MOIRE METHOD

[1] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J]. OPTICA ACTA, 1970, 17 (12): : 883 - &

[2] INTERFEROMETRIC DISPLACEMENT MEASUREMENT ON SCATTERING SURFACES UTILIZING SPECKLE EFFECT [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (03): : 214 - +

[3] Nishida M., 1964, EXP MECH, V4, P366

[4] YOKOZEKI S, 1971, APPL OPTICS, V10, P1690, DOI 10.1364/AO.10.001690

[5] THEORETICAL INTERPRETATION OF MOIRE PATTERN FOR 2 GRIDS OF PARALLEL LINES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (08) : 1011 - &

[1] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J]. OPTICA ACTA, 1970, 17 (12): : 883 - &

[2] INTERFEROMETRIC DISPLACEMENT MEASUREMENT ON SCATTERING SURFACES UTILIZING SPECKLE EFFECT [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (03): : 214 - +

[3] Nishida M., 1964, EXP MECH, V4, P366

[4] YOKOZEKI S, 1971, APPL OPTICS, V10, P1690, DOI 10.1364/AO.10.001690

[5] THEORETICAL INTERPRETATION OF MOIRE PATTERN FOR 2 GRIDS OF PARALLEL LINES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (08) : 1011 - &