PHOTOREFRACTIVE RESPONSE AT HIGH MODULATION DEPTHS IN BI12TIO20

被引：54

作者：

MILLERD, JE

GARMIRE, EM

KLEIN, MB

WECHSLER, BA

STROHKENDL, FP

BROST, GA

机构：

[1] UNIV SO CALIF,NATL CTR INTEGRATED PHOTON TECHNOL,LOS ANGELES,CA 90089

[2] HUGHES RES LABS,MALIBU,CA 90265

[3] ROME LAB,CTR PHOTON,GRIFFISS AFB,NY 13441

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 1992年 / 9卷 / 08期

关键词：

D O I：

10.1364/JOSAB.9.001449

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present data showing a nonlinear photorefractive response at high modulation depths in a Bi12TiO20 sample when applied ac fields are used. The data are interpreted by means of both a numerical finite-difference model and an analytic theory developed by Swinburne et al. [IEE Proceedings of the International Conference on Holographic Systems, Components and Applications (Institution of Electrical Engineers, London, 1989), p. 175]. Both models provide physical insights into the performance of semiconductor and sillenite materials with ac field enhancements.

引用

页码：1449 / 1453

页数：5

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