W-TEST FOR EXPONENTIALITY WITH ORIGIN KNOWN

被引:33
作者
STEPHENS, MA
机构
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D O I
10.2307/1268158
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
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页码:33 / 35
页数:3
相关论文
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[1]  
HAHN GJ, 1967, STATISTICAL MODELS E
[2]   THEORETICAL EXPLANATION OF OBSERVED DECREASING FAILURE RATE [J].
PROSCHAN, F .
TECHNOMETRICS, 1963, 5 (03) :375-&
[3]   ANALYSIS OF VARIANCE TEST FOR EXPONENTIAL DISTRIBUTION (COMPLETE SAMPLES) [J].
SHAPIRO, SS ;
WILK, MB .
TECHNOMETRICS, 1972, 14 (02) :355-&