MODES OF FAILURE OF MOS DEVICES

被引：11

作者：

ECCLESTON, W

PEPPER, M

机构：

来源：

关键词：

D O I：

10.1016/0026-2714(71)90208-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：325 / +

页数：1

共 32 条

[1] PHOSPHOSILICATE GLASS STABILIZATION OF FET DEVICES [J].

BALK, P ;

ELDRIDGE, JM .

[2]

BALK P, 1965 M EL SOC BUFF

[3]

BESSER PJ, 1966, P S MANUFACTURING IN

[4] ELECTROMIGRATION - A BRIEF SURVEY AND SOME RECENT RESULTS [J].

BLACK, JR .

CHOU, NJ ;

ELDRIDGE, JM .

[6]

ECCLESTON W, TO BE PUBLISHED

[7]

ELDRIDGE JM, 1970, T NY ACAD SCI, V32, P13

FROHMANB.D ;

LENZLINGER, M .

[9]

Grove A S, 1967, PHYS TECHNOLOGY SEMI

[10] AVALANCHE DRIFT INSTABILITY IN PLANAR PASSIVATED P-N JUNCTIONS [J].

GURTLER, RW .