DIRECT IMAGING OF ORDERED SEGREGATION LAYERS IN COPPER DOPED WITH BISMUTH

被引：14

作者：

LUZZI, DE

机构：

[1] Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1991年 / 63卷 / 05期

关键词：

D O I：

10.1080/09500839108214656

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The structure of a faceted SIGMA = 3 grain boundary in bismuth-doped copper is analysed using HREM. Experimental image series are compared with calculated image series of model structures of pure copper boundaries and boundaries containing segregated bismuth. A best match is found with a model structure containing an ordered bismuth segregation layer. The results demonstrate the importance of this experimental method for the characterization of complex grain boundary structures using HREM.

引用

页码：281 / 287

页数：7

共 6 条

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