OPTICAL PROPERTIES OF INDIUM FROM THIN FILM MEASUREMENTS

被引：35

作者：

THEYE, ML

DEVANT, G

机构：

[1] Institut d'Optique, Faculté des Sciences, Paris

[2] Institut d'Optique, Orsay

来源：

THIN SOLID FILMS | 1969年 / 4卷 / 03期

关键词：

D O I：

10.1016/0040-6090(69)90036-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical constants of indium, from 0.5 eV to 6.2 eV, are deduced from the transmittance and reflectance of thin semitransparent films, a method which allows the neglect of the influence of the oxide layer. The results are interpreted in terms of intra and interband transitions. © 1969.

引用

页码：205 / &

共 18 条

[1] METHODE DE CALCUL DES CONSTANTES OPTIQUES DES COUCHES MINCES ABSORBANTES A PARTIR DE MESURES DE REFLEXION ET DE TRANSMISSION
ABELES, F
THEYE, ML
[J]. SURFACE SCIENCE, 1966, 5 (03) : 325 - &
[2] AGEEV LA, 1968, FIZ TVERD TELA+, V9, P2324
[3] FERMI SURFACE AND ELECTRONIC STRUCTURE OF INDIUM
ASHCROFT, NW
LAWRENCE, WE
[J]. PHYSICAL REVIEW, 1968, 175 (03): : 938 - &
[4] STRUCTURE AND RECRYSTALLIZATION OF INDIUM THIN FILM
BOULESTEIX, C
DEVANT, G
MARRAUD, A
RATEAU, R
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 780 - +
[5] BURTIN R, 1964, REV OPTICS, V43, P618
[6] BURTIN R, 1964, REV OPTICS, V43, P463
[7] CROCE P, 1961, REV OPT, V40, P555
[8] DEVANT G, 1969, THESIS PARIS
[9] OPTICAL PROPERTIES OF AG AND CU
EHRENREICH, H
PHILIPP, HR
[J]. PHYSICAL REVIEW, 1962, 128 (04): : 1622 - +
[10] EHRHART J, 1964, REV OPT, V1, P33

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