DELAYED ELECTRON-EMISSION FROM ELECTRONICALLY SPUTTERED C60- IONS

被引：7

作者：

DEMIREV, P

BRINKMALM, G

ERIKSSON, J

PAPALEO, R

HAKANSSON, P

SUNDQVIST, BUR

机构：

[1] Division of Ion Physics, Department of Radiation Sciences, Uppsala University

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.50.9636

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Rates of electron detachment form secondary C60- ions sputtered by swift atomic projectiles (19.7-MeV S, 48.6-MeV Br, and 78.2-MeV I) from C60 films are determined and employed to estimate the internal excitation energy of the sputtered C60- ions. While the C60- -ion yields vary as the third power of the incident ion energy loss in the solid, no dependence has been found in the internal energy content of sputtered C60- ions on ion parameters. These results illustrate the use of C60 fullerenes as a ''molecular thermometer,'' and contribute to the elucidation of the ion-sputtering process.

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收藏

页码：9636 / 9639

页数：4

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