ENERGY DENSITY PROFILES IN CRITICAL FILMS

被引:20
作者
KRECH, M [1 ]
EISENRIEGLER, E [1 ]
DIETRICH, S [1 ]
机构
[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST FESTKORPERFORSCH, D-52425 JULICH, GERMANY
来源
PHYSICAL REVIEW E | 1995年 / 52卷 / 02期
关键词
D O I
10.1103/PhysRevE.52.1345
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Scaling density profiles of critical O(N)-symmetric systems confined to a film geometry are analyzed by field-theoretic renormalization-group techniques in d=4-epsilon spatial dimensions. At bulk criticality we explicitly calculate the energy density profile for five different boundary conditions and determine their corresponding universal scaling functions. In order to discuss the influence of the boundary conditions at the two surfaces of the film on the global shape of the profiles, a suitable exponentiation scheme is constructed, Using these exponentiated scaling functions as well as results from conformal field theory, the shapes of the energy density profiles in d=2,3, and 4 are compared. Finally, we discuss the short-distance behavior of the energy density profiles close to the surfaces of the film as it follows from the knowledge of the full profiles in first order epsilon.
引用
收藏
页码:1345 / 1376
页数:32
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