PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .1. PHYSICAL BASIS

[1] PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .2. COMPUTATIONAL METHODS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10): : 626 - &

[2] BACK SCATTERING OF ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1505 - &

[3] Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[4] CALCULATION OF X-RAY INTENSITIES FROM ELECTRON PROBE SPECIMENS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (03) : 387 - &

[5] Brand JO, 1936, ANN PHYS-BERLIN, V26, P609

[6] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[7] CASTAING R, 1958, RECH AERON, P41

[8] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[9] ANALYSIS OF ALUMINIUM INTERMETALLIC COMPOUNDS BY ELECTRON-PROBE MICROANALYSER [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (02): : 117 - &

[10] DUNCUMB P, 1962, 3 P INT S XRAY OPT X

[1] PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .2. COMPUTATIONAL METHODS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10): : 626 - &

[2] BACK SCATTERING OF ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1505 - &

[3] Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[4] CALCULATION OF X-RAY INTENSITIES FROM ELECTRON PROBE SPECIMENS [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (03) : 387 - &

[5] Brand JO, 1936, ANN PHYS-BERLIN, V26, P609

[6] SUR LES BASES PHYSIQUES DE LANALYSE PONCTUELLE PAR SPECTROGRAPHIE-X [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1955, 16 (04): : 304 - 317

[7] CASTAING R, 1958, RECH AERON, P41

[8] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[9] ANALYSIS OF ALUMINIUM INTERMETALLIC COMPOUNDS BY ELECTRON-PROBE MICROANALYSER [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (02): : 117 - &

[10] DUNCUMB P, 1962, 3 P INT S XRAY OPT X