MAGNETIC AND ELECTRICAL-PROPERTIES OF CUXTIS2

Magnetic susceptibility and electrical resistivity were measured on polycrystalline samples of random intercalation compounds of Cu(x)TiS2 with 0 < x < 0.3. Single-phase samples with 1T structures were prepared for 0 < x less-than-or-equal-to 0.2. In 4.2 K less-than-or-equal-to T less-than-or-equal-to 300 K, the samples showed paramagnetic behavior with small temperature dependence, suggesting itinerant electron magnetism. The resistivity is described by a constant term plus a T(m) one. The exponent m takes values of between 1 and 2, contrary to the previous result. This result suggests that the scattering is not dominated by the usual electron-phonon scattering only.