STEEP MR CHANGE IN NIFE/CU/CO TRILAYERS

被引：2

作者：

TANUMA, T

TAKAHASHI, S

MAEDA, A

KUME, M

KUROKI, K

机构：

[1] New Materials Research Center, Sanyo Electric Co., Ltd., Moriguchi, Osaka 570

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1995年 / 31卷 / 06期

关键词：

D O I：

10.1109/20.489828

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A field sensitivity of about 2%/Oe in magnetoresistance (MR) change has been observed in NiFe(6 nm)/Cu/Co(5 nm) trilayers. The MR change was accompanied with a sharp increase in resistivity before decreasing steeply for increasing fields. Thickness of the Cu spacer layer influenced the sensitivity of MR change. These results suggest an existence of interlayer coupling between the two magnetic layers. An analysis of this MR effect suggests that biquadratic coupling plays an important role in the steep MR change.

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收藏

页码：3955 / 3957

页数：3

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