MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS

被引:14
作者
KANAYA, K
KIHARA, H
ISHIGAKI, F
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D O I
10.1016/0047-7206(81)90039-X
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TH742 [显微镜];
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页码:105 / 121
页数:17
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