MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS

被引：14

作者：

KANAYA, K

KIHARA, H

ISHIGAKI, F

机构：

来源：

关键词：

D O I：

10.1016/0047-7206(81)90039-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：105 / 121

页数：17

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