ACOUSTIC ANOMALIES IN AMORPHOUS THIN-FILMS OF SI AND SIO2

被引：50

作者：

VONHAUMEDER, M

STROM, U

HUNKLINGER, S

机构：

来源：

PHYSICAL REVIEW LETTERS | 1980年 / 44卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.44.84

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：84 / 87

页数：4

共 19 条

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