ELECTROREFLECTANCE IN AMORPHOUS GERMANIUM REVISITED

被引：8

作者：

FISCHER, JE

机构：

来源：

PHYSICAL REVIEW LETTERS | 1971年 / 27卷 / 17期

关键词：

D O I：

10.1103/PhysRevLett.27.1131

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1131 / &

共 13 条

[1] ELECTROREFLECTANCE SPECTRA DUE TO FREE CARRIERS IN SEMICONDUCTORS [J].

AXE, JD ;

HAMMER, R .

PHYSICAL REVIEW, 1967, 162 (03) :700-&

[2]

BENNETT HE, 1967, PHYS THIN FILMS, V4, P31

[3] STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS [J].

BRODSKY, MH ;

TITLE, RS ;

WEISER, K ;

PETTIT, GD .

PHYSICAL REVIEW B, 1970, 1 (06) :2632-&

[4] ESR AND OPTICAL ABSORPTION STUDIES OF ION-IMPLANTED SILICON [J].

CROWDER, BL ;

TITLE, RS ;

BRODSKY, MH ;

PETTIT, GD .

APPLIED PHYSICS LETTERS, 1970, 16 (05) :205-&

[5] OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM FILMS [J].

DONOVAN, TM ;

SPICER, WE ;

BENNETT, JM ;

ASHLEY, EJ .

PHYSICAL REVIEW B, 1970, 2 (02) :397-&

[6] A HIGH DENSITY FORM OF AMORPHOUS GE [J].

DONOVAN, TM ;

ASHLEY, EJ ;

SPICER, WE .

PHYSICS LETTERS A, 1970, A 32 (02) :85-&

[7]

FISCHER J, TO BE PUBLISHED

[8]

Fischer J. E., 1971, Optics Communications, V3, P116, DOI 10.1016/0030-4018(71)90192-1

[9] DETERMINATION OF OPTICAL CONSTANTS - DISORDERED GERMANIUM [J].

JUNGK, G .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 44 (01) :239-&

[10] ELECTROREFLECTANCE OF DISORDERED GERMANIUM FILMS [J].

PILLER, H ;

SERAPHIN, BO ;

MARKEL, K ;

FISCHER, JE .

PHYSICAL REVIEW LETTERS, 1969, 23 (14) :775-&

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