TOLERANCE ANALYSIS OF CASCADED STRUCTURES

被引：1

作者：

BANDLER, JW ^{[1
]}

RIZK, MRM ^{[1
]}

机构：

[1] MCMASTER UNIV,DEPT ELECT & COMP ENGN,HAMILTON L8S 4L7,ONTARIO,CANADA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1980年 / 28卷 / 08期

关键词：

D O I：

10.1109/TMTT.1980.1130196

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：935 / 938

页数：4

共 7 条

[1] WORST CASE NETWORK TOLERANCE OPTIMIZATION [J].

BANDLER, JW ;

LIU, PC ;

CHEN, JHK .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1975, 23 (08) :630-641

[2] NEW RESULTS IN NETWORK SIMULATION, SENSITIVITY, AND TOLERANCE ANALYSIS FOR CASCADED STRUCTURES [J].

BANDLER, JW ;

RIZK, MRM ;

ABDELMALEK, HL .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1978, 26 (12) :963-972

[3] NEW RESULTS IN LEAST PTH APPROACH TO MINIMAX DESIGN [J].

BANDLER, JW ;

CHARALAMBOUS, C ;

CHEN, JHK ;

CHU, WY .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (02) :116-119

[4] AUTOMATED NETWORK DESIGN WITH OPTIMAL TOLERANCES [J].

BANDLER, JW ;

LIU, PC .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1974, AS21 (02) :219-222

[5] GENERAL THEORY AND DESIGN OF OPTIMUM QUARTER-WAVE TEM FILTERS [J].

HORTON, MC ;

WENZEL, RJ .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1965, MT13 (03) :316-&

[6] MULTIPARAMETER LARGE-CHANGE SENSITIVITY ANALYSIS AND SYSTEMATIC EXPLORATION [J].

LEUNG, KH ;

SPENCE, R .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1975, 22 (10) :796-804

[7]

TROMP H, 1978, THESIS U GHENT GHENT

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