FABRICATION OF 2-DIMENSIONAL ARRAYS OF NANOMETER-SIZE CLUSTERS WITH THE ATOMIC-FORCE MICROSCOPE

被引：176

作者：

SCHAEFER, DM ^{[1
]}

REIFENBERGER, R ^{[1
]}

PATIL, A ^{[1
]}

ANDRES, RP ^{[1
]}

机构：

[1] PURDUE UNIV,SCH CHEM ENGN,W LAFAYETTE,IN 47907

来源：

APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 08期

关键词：

D O I：

10.1063/1.113589

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An atomic force microscope tip is used as a vector positioner to manipulate nanometer-size preformed Au clusters deposited on atomically smooth substrates. Using this technique, two-dimensional cluster nanostructures can be assembled at room temperature.© 1995 American Institute of Physics.

引用

收藏

页码：1012 / 1014

页数：3

相关论文

共 14 条

[1]

AKARI S, 1993, ANN PHYS-LEIPZIG, V2, P141, DOI 10.1002/andp.19935050206

[2] AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].

ALEXANDER, S ;

HELLEMANS, L ;

MARTI, O ;

SCHNEIR, J ;

ELINGS, V ;

HANSMA, PK ;

LONGMIRE, M ;

GURLEY, J .

JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167

[3] SUPERCOMPUTING WITH SPIN-POLARIZED SINGLE ELECTRONS IN A QUANTUM COUPLED ARCHITECTURE [J].

BANDYOPADHYAY, S ;

DAS, B ;

MILLER, AE .

NANOTECHNOLOGY, 1994, 5 (02) :113-133

[4] DIRECT IMAGING OF 13-A-DIAM AU CLUSTERS USING SCANNING TUNNELING MICROSCOPY [J].

BARO, AM ;

BARTOLOME, A ;

VAZQUEZ, L ;

GARCIA, N ;

REIFENBERGER, R ;

CHOI, E ;

ANDRES, RP .

APPLIED PHYSICS LETTERS, 1987, 51 (20) :1594-1596

[5] STUDIES OF INDIVIDUAL NANOMETER-SIZED METALLIC CLUSTERS USING SCANNING TUNNELING MICROSCOPY, FIELD-EMISSION, AND FIELD-ION MICROSCOPY [J].

CASTRO, T ;

LI, YZ ;

REIFENBERGER, R ;

CHOI, E ;

PARK, SB ;

ANDRES, RP .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2845-2849

[6]

CHOI E, 1987, PHYSICS CHEM SMALL C, P61

[7] Quantum cellular automata [J].

Lent, Craig S. ;

Tougaw, P.Douglas ;

Porod, Wolfgang ;

Bernstein, Gary H. .

Nanotechnology, 1993, 4 (01) :49-57

[8] SUBSTRATE-INDUCED DEFORMATION OF NANOMETER-SIZE GOLD CLUSTERS STUDIED BY NONCONTACT AFM AND TEM [J].

MAHONEY, W ;

SCHAEFER, DM ;

PATIL, A ;

ANDRES, RP ;

REIFENBERGER, R .

SURFACE SCIENCE, 1994, 316 (03) :383-390

[9] CORRECTION [J].

MEYER, G .

APPLIED PHYSICS LETTERS, 1988, 53 (24) :2400-2400

[10] NOVEL OPTICAL APPROACH TO ATOMIC FORCE MICROSCOPY [J].

MEYER, G ;

AMER, NM .

APPLIED PHYSICS LETTERS, 1988, 53 (12) :1045-1047