BEAM PHENOMENA AT AND NEAR CRITICAL INCIDENCE UPON A DIELECTRIC INTERFACE

被引：47

作者：

CHAN, CC ^{[1
]}

TAMIR, T ^{[1
]}

机构：

[1] POLYTECH UNIV,DEPT ELECT ENGN & COMP SCI,BROOKLYN,NY 11201

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1987年 / 4卷 / 04期

关键词：

D O I：

10.1364/JOSAA.4.000655

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：655 / 663

页数：9

共 19 条

[1] GAUSSIAN-BEAM INTERACTION WITH A PLANAR DIELECTRIC INTERFACE [J].

ANTAR, YM ;

BOERNER, WM .

CANADIAN JOURNAL OF PHYSICS, 1974, 52 (11) :962-972

[2]

Bertoni H. L., 1985, Traitement du Signal, V2, P201

[3] FOCAL SHIFT AND RAY MODEL FOR TOTAL INTERNAL-REFLECTION [J].

CARNIGLIA, CK ;

BROWNSTEIN, KR .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (01) :121-123

[4] ANGULAR SHIFT OF A GAUSSIAN-BEAM REFLECTED NEAR THE BREWSTER-ANGLE [J].

CHAN, CC ;

TAMIR, T .

OPTICS LETTERS, 1985, 10 (08) :378-380

[5] LONGITUDINAL AND TRANSVERSE DISPLACEMENTS OF A BOUNDED MICROWAVE BEAM AT TOTAL INTERNAL-REFLECTION [J].

COWAN, JJ ;

ANICIN, B .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (10) :1307-1314

[6]

GRADSHTEYN IS, 1980, TABLE INTEGRALS SERI, P337

[7] LATERAL DISPLACEMENT OF A LIGHT BEAM AT A DIELECTRIC INTERFACE [J].

HOROWITZ, BR ;

TAMIR, T .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) :586-&

[8] GOOS-HANCHEN EFFECT AROUND AND OFF THE CRITICAL ANGLE [J].

LAI, HM ;

CHENG, FC ;

TANG, WK .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (04) :550-557

[9]

LOTSCH HKV, 1970, OPTIK, V32, P189

[10]

LOTSCH HKV, 1970, OPTIK, V32, P116

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