X-RAY DIFFRACTION BY RANDOM LAYERS - IDEAL LINE PROFILES AND DETERMINATION OF STRUCTURE AMPLITUDES FROM OBSERVED LINE PROFILES

被引：84

作者：

WILSON, AJC

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1949年 / 2卷 / 04期

关键词：

D O I：

10.1107/S0365110X49000631

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：245 / 251

页数：7

共 14 条

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