MAGNETIC DOMAIN-STRUCTURE IN ULTRATHIN FILMS

被引:119
作者
BOCHI, G [1 ]
HUG, HJ [1 ]
PAUL, DI [1 ]
STIEFEL, B [1 ]
MOSER, A [1 ]
PARASHIKOV, I [1 ]
GUNTHERODT, HJ [1 ]
OHANDLEY, RC [1 ]
机构
[1] UNIV BASEL,INST PHYS,BASEL,SWITZERLAND
关键词
D O I
10.1103/PhysRevLett.75.1839
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The first magnetic force microscope (MFM) images of a series of epitaxial magnetic thin films is presented. The films studied, Ni/Cu/Si(001) capped by 2 nm of Cu, exhibit perpendicular magnetization over an exceptionally broad Ni thickness range 2 < h < 14 nm. The Ni domain structure shows a sharp transition to a finer length scale above a finite critical thickness of order 9 nm. The average force measured by the MFM tip reflects this refinement in domain structure. Micromagnetic theory, combined with our measurements of K-eff(h), provides the first quantitative description for these general but previously unexplained phenomena.
引用
收藏
页码:1839 / 1842
页数:4
相关论文
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