INSITU LASER REFLECTANCE MEASUREMENT OF DIFFUSE SURFACES

被引:3
作者
CHAN, WS [1 ]
KHAN, SU [1 ]
机构
[1] MICHIGAN TECHNOL UNIV,KEWEENAW RES CTR,HOUGHTON,MI 49931
来源
APPLIED OPTICS | 1978年 / 17卷 / 15期
关键词
D O I
10.1364/AO.17.002335
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2335 / 2339
页数:5
相关论文
共 6 条
[1]   RETROREFLECTANCE MEASUREMENTS OF PHOTOMETRIC STANDARDS AND COATINGS [J].
EGAN, WG ;
HILGEMAN, T .
APPLIED OPTICS, 1976, 15 (07) :1845-1849
[2]  
MEYERARENDT JR, 1972, INTRO CLASSICAL MODE, P341
[3]   A COMPARISON OF INFRARED-EMITTANCE MEASUREMENTS AND MEASUREMENT TECHNIQUES [J].
MILLARD, JP ;
STREED, ER .
APPLIED OPTICS, 1969, 8 (07) :1485-&
[4]   FAR INFRARED REFLECTOMETER FOR IMPERFECTLY DIFFUSE SPECIMENS [J].
NEHER, RT ;
EDWARDS, DK .
APPLIED OPTICS, 1965, 4 (07) :775-&
[5]  
STITCH ML, 1972, LASER HDB, V2, P1746
[6]   HEMI-ELLIPSOIDAL MIRROR INFRARED REFLECTOMETER - DEVELOPMENT AND OPERATION [J].
WOOD, BE ;
PIPES, JG ;
SMITH, AM ;
ROUX, JA .
APPLIED OPTICS, 1976, 15 (04) :940-950