AN ANALYTICAL MODEL FOR THE NON-QUASI-STATIC SMALL-SIGNAL BEHAVIOR OF SUBMICRON MOSFETS

被引:24
作者
SMEDES, T [1 ]
KLAASSEN, FM [1 ]
机构
[1] EINDHOVEN UNIV TECHNOL,FAC ELECT ENGN,5600 MB EINDHOVEN,NETHERLANDS
关键词
D O I
10.1016/0038-1101(94)E0032-A
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new, analytical Non-Quasi-Static model, in terms of admittance parameters, for the small-signal behaviour of short channel MOSFETs is presented. The relevant short channel effects are included explicitly in the derivation of the model. The effects of approximating the exact analytical solutions are discussed. A new approximation for extremely high frequencies is proposed. The model is consistent with previously published low frequency models and shows good agreement with 2D device simulations and measurements. Finally the influence of parasitics is illustrated.
引用
收藏
页码:121 / 130
页数:10
相关论文
共 29 条
[1]  
Abramovitz M., 1970, HDB MATH FUNCTIONS
[2]   A SMALL-SIGNAL DC-TO-HIGH-FREQUENCY NONQUASISTATIC MODEL FOR THE 4-TERMINAL MOSFET VALID IN ALL REGIONS OF OPERATION [J].
BAGHERI, M ;
TSIVIDIS, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (11) :2383-2391
[3]  
CHAI KW, 1987, IEEE ELECTR DEVICE L, V8, P377, DOI 10.1109/EDL.1987.26666
[4]  
DEGRAAF HC, 1990, COMPACT TRANSISTOR M
[5]   SINGLE POLYSILICON LAYER ADVANCED SUPER HIGH-SPEED BICMOS TECHNOLOGY [J].
DEJONG, JL ;
LANE, R ;
VANSCHRAVENDIJK, B ;
CONNER, G .
PROCEEDINGS OF THE 1989 BIPOLAR CIRCUITS AND TECHNOLOGY MEETING, 1989, :182-185
[6]   DIRECT METHOD FOR CALCULATION OF EDGE CAPACITANCE OF THICK ELECTRODES [J].
KAMCHOUCHI, HE ;
ZAKY, AA .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (12) :1365-1371
[7]   SMALL-SIGNAL HIGH-FREQUENCY EQUIVALENT CIRCUIT FOR METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR [J].
HASLETT, JW ;
TROFIMENKOFF, FN .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1969, 116 (05) :699-+
[8]   OPTIMAL 2ND-ORDER SMALL-SIGNAL MODEL FOR LONG-CHANNEL AND SHORT-CHANNEL 3-TERMINAL MOSFET/MODFET WAVE-EQUATION [J].
KANG, SC ;
ROBLIN, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (08) :1909-1915
[9]  
KLAASSEN FM, 1988, J PHYSIQUE C, V4, P257
[10]   TECHNIQUES FOR SMALL-SIGNAL ANALYSIS OF SEMICONDUCTOR-DEVICES [J].
LAUX, SE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (10) :2028-2037