ON THE DIELECTRIC CONSTANT OF GERMANIUM AT MICROWAVE FREQUENCIES

[1] DIELECTRIC CONSTANT OF GERMANIUM AND SILICON AS A FUNCTION OF VOLUME [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 8 : 204 - 206

[2] CARDONA M, 1958, BRUSSELS SOLID STATE

[3] DIRECT MEASUREMENT OF THE DIELECTRIC CONSTANTS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1953, 92 (06): : 1396 - 1397

[4] MICROWAVE DETERMINATION OF THE AVERAGE MASSES OF ELECTRONS AND HOLES IN GERMANIUM [J]. PHYSICAL REVIEW, 1955, 98 (06): : 1761 - 1763

[5] MONTGOMERY EG, 1947, TECHNIQUE MICROWAVE

[6] Moss TS., 1959, OPTICAL PROPERTIES S

[7] INFRARED REFRACTIVE INDEXES OF SILICON GERMANIUM AND MODIFIED SELENIUM GLASS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (03) : 244 - 246

[1] DIELECTRIC CONSTANT OF GERMANIUM AND SILICON AS A FUNCTION OF VOLUME [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1959, 8 : 204 - 206

[2] CARDONA M, 1958, BRUSSELS SOLID STATE

[3] DIRECT MEASUREMENT OF THE DIELECTRIC CONSTANTS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1953, 92 (06): : 1396 - 1397

[4] MICROWAVE DETERMINATION OF THE AVERAGE MASSES OF ELECTRONS AND HOLES IN GERMANIUM [J]. PHYSICAL REVIEW, 1955, 98 (06): : 1761 - 1763

[5] MONTGOMERY EG, 1947, TECHNIQUE MICROWAVE

[6] Moss TS., 1959, OPTICAL PROPERTIES S

[7] INFRARED REFRACTIVE INDEXES OF SILICON GERMANIUM AND MODIFIED SELENIUM GLASS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (03) : 244 - 246