PROTON AND SODIUM TRANSPORT IN SIO2 FILMS

[1] TRACER EVALUATION OF HYDROGEN IN STEAM-GROWN SIO2 FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (2P1) : 196 - &

[2] CARLSON HG, OCT EL SOC M PHIL

[3] FOWKES FM, 1966, OCT EL SOC M PHIL

[4] GREGOR LV, 1966, MAY EL SOC M

[5] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[6] STABILIZATION OF MOS DEVICES [J]. SOLID-STATE ELECTRONICS, 1967, 10 (07) : 657 - +

[7] HOFSTEIN SR, 1965, APPL PHYS LETT

[8] KERR DR, 1967, JUN SOL STAT DEV RES

[9] KERR DR, 1967, MAR SILC INT SPEC C

[10] LOGAN JS, 1965, JUN SOL STAT DEV RES

[1] TRACER EVALUATION OF HYDROGEN IN STEAM-GROWN SIO2 FILMS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (2P1) : 196 - &

[2] CARLSON HG, OCT EL SOC M PHIL

[3] FOWKES FM, 1966, OCT EL SOC M PHIL

[4] GREGOR LV, 1966, MAY EL SOC M

[5] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[6] STABILIZATION OF MOS DEVICES [J]. SOLID-STATE ELECTRONICS, 1967, 10 (07) : 657 - +

[7] HOFSTEIN SR, 1965, APPL PHYS LETT

[8] KERR DR, 1967, JUN SOL STAT DEV RES

[9] KERR DR, 1967, MAR SILC INT SPEC C

[10] LOGAN JS, 1965, JUN SOL STAT DEV RES