RESISTIVITY OF FINE PLATINUM WIRES

被引:15
作者
FREEMAN, RH
BLATT, FJ
BASS, J
机构
[1] Department of Physics, Michigan State University, East Lansing, 48823, Michigan
来源
PHYSIK DER KONDENSITERTEN MATERIE | 1969年 / 9卷 / 03期
关键词
D O I
10.1007/BF02422571
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We have measured the resistivity of pure platinum wires ranging in diameter from 16 mil to 0.3 mil in the temperature range 1.2 to 4.2°K, and observed size-dependent deviations from Matthiessen's rule. The temperature dependent portion of the resistivity is dominated in this temperature range by a term of the form AT2, where A increases from about 12×10-12 Ω cm/°K2 for the thickest wires to 18×10-12 Ω cm/°K2 for the thinnest ones. There is an additional resistivity contribution which appears to increase more rapidly than T5, and which also evidences some increase with decreasing wire diameter. The observed deviations from Matthiessen's rule display temperature and size variations consistent with the theory of Blatt and Satz, and the magnitude of the deviations can be accounted for by this theory taking into account only that portion of the electrical resistivity produced by electron-phonon scattering. Thus the data are consistent with arguments suggesting that interband electron-electron scattering does not lead to size-dependent deviations from Matthiessen's rule. © 1969 Springer-Verlag.
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页码:271 / +
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