RAY INTERPRETATION OF THE MATERIAL SIGNATURE IN THE ACOUSTIC MICROSCOPE

被引：167

作者：

PARMON, W

BERTONI, HL

机构：

[1] Polytechnic Institute of New York, Brooklyn, New York

来源：

ELECTRONICS LETTERS | 1979年 / 15卷 / 21期

关键词：

Acoustic microscopes;

D O I：

10.1049/el:19790486

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The output voltage of the reflection acoustic microscope depends on the location of the object surface in a way that is characteristic of its elastic properties. We present a ray model showing that this dependence is due to interference between a narrow bundle of axial rays and rays associated with the leaky Rayleigh wave excited on the surface. © 1979, The Institution of Electrical Engineers. All rights reserved.

引用

页码：684 / 686

页数：3

共 5 条

[1] PHASE IMAGING IN REFLECTION WITH ACOUSTIC MICROSCOPE [J].