EFFECT OF NOISE AND CAPACITANCE ON THE DYNAMICAL CHARACTERISTICS OF HIGH-T(C) JOSEPHSON-JUNCTIONS

被引：23

作者：

BUSSE, F

NEBEL, R

HERZOG, P

DARULA, M

SEIDEL, P

机构：

[1] FRIEDRICH SCHILLER UNIV, INST FESTKORPERPHYS, O-6900 JENA, GERMANY

[2] SAS, INST ELECT ENGN, CS-84239 BRATISLAVA, CZECHOSLOVAKIA

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 12期

关键词：

D O I：

10.1063/1.110685

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The dynamical characteristics of Josephson junctions at finite temperatures are simulated in the resistively shunted junction model including a capacitance and a current source producing white noise. It is shown how the height and the shape of the Shapiro steps as a function of the microwave amplitude are affected by noise as well as by the capacitance. The results of the simulations are found to be in good agreement with recently published experimental data on different types of Josephson weak links fabricated from high-T(c) materials.

引用

页码：1687 / 1689

页数：3

共 22 条

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