DETERMINING THE ENERGY RESPONSE OF A SILICON SURFACE-BARRIER DETECTOR TO INCIDENT 3-KEV TO 25-KEV ELECTRONS

被引:3
作者
AXELSSON, J
REIMANN, CT
机构
[1] Division of Ion Physics, Department of Radiation Sciences, Uppsala University, S-751 21 Uppsala
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1016/0168-583X(94)95640-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An energy-sensitive silicon surface-barrier detector is employed to measure the number of secondary electrons emitted during a collision between an energetic macromolecular ion and a surface. Each extracted secondary electron impacts the detector with energy U, but due to backscattering and other effects, only energy etaU is deposited in the detector. The electron energy deposition function, eta = eta(U) less-than-or-equal-to 1, is not well known for the 3- to 25-keV energies employed in our setup. In this paper, eta(U) is measured with a specially developed compact electron-pulse source placed at variable potential relative to the detector. For a particular detector, it was found that eta(U) = k(1 - 1.59/ square-rootU), where U is in units of keV. Although the proportionality constant k is not directly determined in this experiment, an estimate of k almost-equal-to 1.35 was calculated by combining literature values of the electron transmission probability of the detector gold window and the electron backscattering coefficient for silicon for 20 keV electrons.
引用
收藏
页码:499 / 504
页数:6
相关论文
共 26 条
[1]   SECONDARY-ELECTRON EMISSION FROM SURFACES IMPACTED BY MULTIPLY-CHARGED POLYATOMIC IONS [J].
AXELSSON, J ;
REIMANN, CT ;
SUNDQVIST, BUR .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 88 (1-2) :131-137
[2]  
AXELSSON J, 1994, NUCL INSTR METH B, V88
[3]  
AXELSSON J, UNPUB
[4]  
BRONSHTEIN IM, 1961, FIZ TVERD TELA, V3, P1188
[5]   MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS .2. RANGE-ENERGY RELATIONS [J].
COSSLETT, VE ;
THOMAS, RN .
BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (11) :1283-&
[6]   RESPONSE OF SI AND GAP P-N JUNCTIONS TO A 5- TO 40-KEV ELECTRON BEAM [J].
CZAJA, W .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (11) :4236-&
[7]   DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J].
EVERHART, TE ;
HOFF, PH .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) :5837-&
[8]   ENERGY FOR ELECTRON-HOLE PAIR GENERATION IN SILICON BY ALPHA PARTICLES [J].
FABRI, G ;
SVELTO, V ;
GATTI, E .
PHYSICAL REVIEW, 1963, 131 (01) :134-&
[9]   ON THE DETECTION OF LARGE ORGANIC IONS BY SECONDARY-ELECTRON PRODUCTION [J].
HEDIN, A ;
HAKANSSON, P ;
SUNDQVIST, BUR .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1987, 75 (03) :275-289
[10]   INTERPRETATION OF RANGE MEASUREMENTS FOR KILOVOLT ELECTRONS IN SOLIDS [J].
KANTER, H ;
STERNGLASS, EJ .
PHYSICAL REVIEW, 1962, 126 (02) :620-&