EFFECT OF MICROVOID SIZE ON POSITRON-ANNIHILATION CHARACTERISTICS AND RESIDUAL RESISTIVITY IN METALS

被引：169

作者：

HAUTOJARVI, P

HEINIO, J

MANNINEN, M

NIEMINEN, R

机构：

[1] HELSINKI UNIV TECHNOL,DEPT TECH PHYS,SF-02150 ESPOO 15,FINLAND

[2] NORDITA,COPENHAGEN,DENMARK

来源：

PHILOSOPHICAL MAGAZINE | 1977年 / 35卷 / 04期

关键词：

D O I：

10.1080/14786437708232638

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：973 / 981

页数：9

共 20 条

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