TECHNIQUE FOR OBTAINING THIN GLASS SECTIONS FOR TRANSMISSION ELECTRON MICROSCOPY

被引:7
作者
TURKALO, AM
机构
关键词
D O I
10.1111/j.1151-2916.1968.tb11926.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:470 / &
相关论文
共 12 条
[1]   EVAPORATED CARBON FILMS FOR USE IN ELECTRON MICROSCOPY [J].
BRADLEY, DE .
BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (FEB) :65-69
[2]   TRANSMISSION ELECTRON MICROSCOPY OF GLASS-CERAMICS [J].
DOHERTY, PE ;
LEOMBRUNO, RR .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1964, 47 (08) :368-370
[3]  
HAINE ME, 1961, ELECTRON MICROSCOPE
[4]  
Heidenreich R.D., 1964, FUNDAMENTALS TRANSMI
[5]  
JAFFE MS, 1948, J APPL PHYS, V19, P1191
[6]   Determination of object thickness in electron microscopy [J].
Marton, L ;
Schiff, LI .
JOURNAL OF APPLIED PHYSICS, 1941, 12 (10) :759-765
[7]  
MORIYA Y, 1967, J CERAM ASSOC JAPAN, V75, P363
[8]   ELECTRON MICROSCOPE INVESTIGATION OF GLASS [J].
PREBUS, AF ;
MICHENER, JW .
INDUSTRIAL AND ENGINEERING CHEMISTRY, 1954, 46 (01) :147-153
[9]   TRANSMISSION ELECTRON MICROSOCPY OF THIN GLASSSAMPLES [J].
SEWARD, TP ;
UHLMANN, DR ;
TURNBULL, D ;
PIERCE, GR .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1967, 50 (01) :25-&
[10]  
STANWORTH JE, 1950, PHYSICAL PROPERTIES, P65